Technological applications will be presented alongside fundamental measurements and theories. The main scientific areas include:

• Fundamental physical phenomena;
• Point and extended defects in wide band-gap systems;
• Defects at surfaces and interfaces;
• Thin films and low-dimensional systems;
• Nanocrystals, colloids and aggregates;
• Defects and material preparation technology;
• Defects modeling and computational methods;
• Radiation effects, radiation induced defects, colour centers;
• Luminescence spectroscopy of excitons, impurities, and defects, including using of synchrotron radiation;
• Electronic excitations, excited state dynamics, radiative and non-radiative relaxations;
• Scintillation, energy transfer and storage, carrier trapping phenomena;
• Laser active centers;
• Defect related non-linear optical phenomena;
• Phonons and defects, electron-phonon interactions;
• Defect diffusion, ionic relaxations, ionic transport;
• Technological applications including:
  – Radiological and radiometric imaging and detection (scintillators and dosimeters);
  – Optical devices and photonics, photorefractive electro-optics, optical fibres, lasers;
  – Materials for opto-electronics, photonics and micro-electronics;
  – Solid electrolytes, fuel cells, electrochemical sensors, fast ionic conductors;

EuroDIM-15 will provide a great opportunity to exchange ideas, allowing for fruitful discussions between industrial, academic, and scientific participants from diverse fields.  The workshop will include plenary, keynotes, invited, oral presentations, poster sessions, and industrial exhibits.  Industry participants are invited to present open issues that will encourage participants to address these issues in the future.

Rob Jackson (UK) – Chair
Akira Yoshikawa (Japan)
Alan Chadwick (UK)
Aleksandr Lushchik (Estonia)
Alma Dauletbekova (Kazakhstan)
Anatoli Popov (Latvia)
Chris Stanek (USA)
Christophe Dujardin (France)
Eduardo Yukihara (Switzerland)
Graeme Watson (Ireland)
Henk Vrielinck (Belgium)
Krisztian Lengyel (Hungary)
Juan Maria Garcia Lastro (Denmark)
Maksym Buryi (Czechia)
Mario Valerio (Brazil)
Marius Stef (Romania)
Massimo Piccanini (Italy)
Phuti Ngoepe (South Africa)
Roberto Lorenzi (Italy)
Siegmund Greulich-Weber (Germany)
Volkmar Dierolf (USA)
Yuriy Zorenko (Poland)

Aleksandr Lushchik | University of Tartu, Tartu, Estonia, Recent studies of Frenkel defects induced in metal oxides either by swift heavy ions or fast fission neutrons using optical and EPR methods
Henk Vrielinck | Ghent University, Gent, Belgium, Electron paramagnetic resonance spectroscopy of defects in materials for radiophotoluminescence radiation detection
Shelja Sharma | University of Latvia, Latvia
Inesh Kenzhina | Satbayev University, Almaty, Kazakhstan
Irene Villa | University of Milano-Bicocca, Milano, Italy
Francesca Cova | University of Milano-Bicocca, Milano, Italy
Gheorghe Lucian | National Institute for Laser, Plasma and Radiation Physics, Magurele, Romania
Silviu Polosan | National Institute of Materials Physics, Magurele, Romania
Sergiu Vatavu | Moldova State University, Republic of Moldova
Simonpietro Agnello | University of Palermo, Italia, 2D MoS₂ from thermal stability to irradiation induced modifications
Philippe Veber |  West University of Timisoara

Hanna Bandarenka | Belarusian State University of Informatics and Radioelectronics, Recent progress in optical characterization of silicon microchips

Mamoru Kitaura | Yamagata University | Japan

Full-length papers will be refereed for publication in a special issue. The journal will be announced.